首页> 外文期刊>International Journal of Electrochemical Science >Formation and Characterization of the High Precision Nanoscale Thin Film Resistors on Radio Frequency Application [Int. J. Electrochem. Sci., 10 (2015) 6517-6526]
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Formation and Characterization of the High Precision Nanoscale Thin Film Resistors on Radio Frequency Application [Int. J. Electrochem. Sci., 10 (2015) 6517-6526]

机译:射频应用中高精度纳米薄膜电阻器的形成与表征J.电化学。 Sci。,10(2015)6517-6526]

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摘要

The affiliations of the author Huei Yu Huang were not assigned correctly in the paper and theaffiliations should be added “School of Dentistry, College of Oral Medicine, Taipei MedicalUniversity, Taipei, Taiwan”.
机译:本文未正确分配作者Huei Yu Huang的隶属关系,而应添加隶属关系“台湾台北医学大学口腔医学院牙医学院。”

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