The Overoxidation of poly(3-hexylthiophene) (P3HT) Thin Film: CV and EIS measurements

Roger Gonc?alves; Ernesto C. Pereira; Lui?s F. Marchesi

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The Overoxidation of poly(3-hexylthiophene) (P3HT) Thin Film: CV and EIS measurements

机译：聚（3-己基噻吩）（P3HT）薄膜的过氧化：CV和EIS测量

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In this study the electrochemical degradation of electropolymerized poly (3-hexylthiophene) (P3HT) thin film electrode was carried out by mild overoxidation conditions. Cyclic voltammetry (CV) showed the material electrochemical response lost by change in the intensity and position of the oxidation/reduction peak. Electrochemical impedance spectroscopy (EIS) showed an increase in the charge-transfer resistance (Rct) and a decrease of the low-frequency capacitance related to the load of the intercalated charge in the polymeric film. Such behavior was assigned to a hindering in the ionic intercalation/deintercalation process across the polymer/electrolyte interface, which was also corroborated by the dielectric relaxation time (τ0) analysis.

机译：在这项研究中，电聚合的聚（3-己基噻吩）（P3HT）薄膜电极的电化学降解是在温和的过氧化条件下进行的。循环伏安法（CV）显示，由于氧化/还原峰的强度和位置的变化，材料的电化学响应损失了。电化学阻抗谱（EIS）显示，与聚合物薄膜中嵌入电荷的负荷有关的电荷转移电阻（Rct）增大，低频电容减小。这种行为被认为是阻碍聚合物/电解质界面上离子嵌入/脱嵌过程的障碍，而介电弛豫时间（τ0）分析也证实了这一点。

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《International Journal of Electrochemical Science》 |2017年第3期|共9页
作者
Roger Gonc?alves; Ernesto C. Pereira; Lui?s F. Marchesi;
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The Overoxidation of poly(3-hexylthiophene) (P3HT) Thin Film: CV and EIS measurements

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