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首页> 外文期刊>International Journal of Engineering & Technology >Electrostatic field theoretic approach to analyze the partial discharge phenomenon pertaining to insulation degradation
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Electrostatic field theoretic approach to analyze the partial discharge phenomenon pertaining to insulation degradation

机译：静电场理论方法来分析与绝缘退化有关的局部放电现象

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This paper elucidates the application of electrostatic field theory to analyze partial discharge due to the void formation inside the insulating material. Formation of voids leads to accumulation of static charges leading to capacitance build-up. The most probable cause of insulation failure is due to the subjection of high voltage. Prolonged high voltage poses a threat and leads to insulation failure. Failures occur in the tip gap between the conductor and insulating material’s inner periphery. Probable causes of such failures are corona discharge, surface discharge and treeing, leading to formation of Lichtenberger figures in the material and cavity discharge. This paper presents a way of fabricating the inner lining of the insulator with a semiconductor layer obeying avalanche breakdown at breakdown voltage or voltages at which partial discharge is likely to occur. With the onset of high voltage which can cause a discharge, the semiconductor experiences avalanche breakdown giving out a single photon ejection by Geiger mode (principle). A superior prevention method of using Teflon for insulation instead of XLPE/PILC has been suggested and simulated using COMSOL. Detection using Avalanche photo-detector(LiDAR) may enable us to track the probable location of the occurrence of partial discharge and isolate the system.
机译：本文阐明了静电场理论在分析由于绝缘材料内部形成空隙而引起的局部放电中的应用。空隙的形成导致静电荷的积累，从而导致电容累积。绝缘故障的最可能原因是高压。长时间的高压会构成威胁，并导致绝缘故障。导体和绝缘材料内周之间的尖端间隙会发生故障。此类故障的可能原因是电晕放电，表面放电和树木生长，从而导致在材料和型腔放电中形成利希滕贝格图形。本文提出了一种制造绝缘体内衬的方法，该绝缘体具有在击穿电压或可能发生局部放电的电压下雪崩击穿的半导体层。随着会引起放电的高电压的出现，半导体经历雪崩击穿，从而通过盖革模式（原理）发出单光子喷射。已经提出并使用COMSOL模拟了一种使用聚四氟乙烯代替XLPE / PILC进行绝缘的高级预防方法。使用雪崩光电探测器（LiDAR）进行检测可以使我们跟踪局部放电发生的可能位置并隔离系统。

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