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首页> 外文期刊>Earth, planets and space: EPS >Automatic scaling of F2-layer parameters from ionograms based on the empirical orthogonal function (EOF) analysis of ionospheric electron density
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Automatic scaling of F2-layer parameters from ionograms based on the empirical orthogonal function (EOF) analysis of ionospheric electron density

机译：基于电离层电子密度的经验正交函数（EOF）分析，从电离图自动缩放F2层参数

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摘要

In this paper we apply a method based on empirical orthogonal function (EOF) analysis to automatically scale the F2-layer parameters obtained from ionograms. For a given location, the F layer?fs height profiles of ionospheric electron density are represented as an EOF series with adjustable coefficients derived from the EOF analysis of electron density profiles obtained from the International Reference Ionosphere (IRI-2001) model or measured ionograms. By adjusting the coefficients of the series and combining image matching technique, we were able to construct a calculated trace that approximates as close as possible the observed ionogram F2 trace. The corresponding parameters are then known, including the critical frequency (foF2), peak height (hmF2) and maximum usable frequency [MUF(3000)F2] of the F2 layer. Polarization information is unnecessary; only an amplitude array is essential. Consequently, this method is universal and can be applied to many kinds of ionograms (even the film ionograms after an appropriate conversion of the information to the digital form from the film ionogram). To evaluate the acceptability of the obtained parameters, large numbers of foF2, hmF2 and MUF(3000)F2 values from the manually scaled ionograms at Wuhan (114.4°E, 30.5°N), China are compared with those from automatically scaled ionograms by the Automatic Real Time Ionogram Scaler with True height (ARTIST) and our method. The results indicate that the scaled parameters are acceptable and stable.
机译：在本文中，我们应用了一种基于经验正交函数（EOF）分析的方法来自动缩放从电离图获得的F2层参数。对于给定的位置，电离层电子密度的F层fsfs高度分布表示为EOF系列，具有可调整的系数，该系数是从国际参考电离层（IRI-2001）模型获得的电子密度分布的EOF分析或实测电离图得出的。通过调整序列的系数并结合图像匹配技术，我们能够构建一个计算出的迹线，该迹线尽可能接近所观察到的离子图F2迹线。然后知道相应的参数，包括F2层的临界频率（foF2），峰高（hmF2）和最大可用频率[MUF（3000）F2]。极化信息是不必要的;仅振幅阵列是必不可少的。因此，该方法是通用的，并且可以应用于多种离子图（甚至在将信息适当地从膜离子图转换为数字形式之后的膜离子图）。为了评估所获得参数的可接受性，将中国武汉市手动缩放离子图的大量foF2，hmF2和MUF（3000）F2值与中国武汉自动缩放离子图的大量foF2，hmF2和MUF（3000）F2值进行了比较。具有真实高度的自动实时离子图缩放器（ARTIST）和我们的方法。结果表明，缩放后的参数是可接受的且稳定的。

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