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Measurement of Three-Dimensional Dipole Orientation of a Single Fluorescent Nanoemitter by Emission Polarization Analysis

机译:发射极化分析法测量单个荧光纳米发射体的三维偶极取向

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We demonstrate theoretically and experimentally that the three-dimensional orientation of a single fluorescent nanoemitter can be determined by polarization analysis of the emitted light (while excitation polarization analysis provides only the in-plane orientation). The determination of the emitter orientation by polarimetry requires a theoretical description, including the objective numerical aperture, the 1D or 2D nature of the emitting dipole, and the environment close to the dipole. We develop a model covering most experimentally relevant microscopy configurations and provide analytical relations that are useful for orientation measurements. We perform polarimetric measurements on high-quality core-shell CdSe/CdS nanocrystals and demonstrate that they can be approximated by two orthogonal degenerated dipoles. Finally, we show that the orientation of a dipole can be inferred by polarimetric measurement, even for a dipole in the vicinity of a gold film, while in this case, the well-established defocused microscopy is not appropriate.
机译:我们在理论上和实验上证明了单个荧光纳米发射体的三维取向可以通过发射光的偏振分析确定(而激发偏振分析仅提供面内取向)。通过极化测定确定发射器方向需要理论上的描述,包括目标数值孔径,发射偶极子的一维或二维特性以及靠近偶极子的环境。我们开发了一个涵盖大多数实验相关显微镜配置的模型,并提供了可用于方向测量的分析关系。我们对高质量的核壳CdSe / CdS纳米晶体进行极化测量,并证明它们可以被两个正交简并偶极子近似。最后,我们表明偶极子的取向可以通过极化测量来推断,即使对于金膜附近的偶极子,在这种情况下,成熟的散焦显微镜也不适用。

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