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首页> 外文期刊>Physical Review X >Directly Characterizing the Relative Strength and Momentum Dependence of Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering
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Directly Characterizing the Relative Strength and Momentum Dependence of Electron-Phonon Coupling Using Resonant Inelastic X-Ray Scattering

机译：利用共振非弹性X射线散射直接表征电子声子耦合的相对强度和动量依赖性

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摘要

The coupling between lattice and charge degrees of freedom in condensed matter materials is ubiquitous and can often result in interesting properties and ordered phases, including conventional superconductivity, charge-density wave order, and metal-insulator transitions. Angle-resolved photoemission spectroscopy and both neutron and nonresonant x-ray scattering serve as effective probes for determining the behavior of appropriate, individual degrees of freedom—the electronic structure and lattice excitation, or phonon dispersion, respectively. However, each provides less direct information about the mutual coupling between the degrees of freedom, usually through self-energy effects, which tend to renormalize and broaden spectral features precisely where the coupling is strong, impacting one’s ability to quantitatively characterize the coupling. Here, we demonstrate that resonant inelastic x-ray scattering, or RIXS, can be an effective tool to directly determine the relative strength and momentum dependence of the electron-phonon coupling in condensed matter systems. Using a diagrammatic approach for an eight-band model of copper oxides, we study the contributions from the lowest-order diagrams to the full RIXS intensity for a realistic scattering geometry, accounting for matrix element effects in the scattering cross section, as well as the momentum dependence of the electron-phonon coupling vertex. A detailed examination of these maps offers a unique perspective into the characteristics of electron-phonon coupling, which complements both neutron and nonresonant x-ray scattering, as well as Raman and infrared conductivity.
机译：凝聚态材料中晶格和电荷自由度之间的耦合是普遍存在的，通常可以产生令人感兴趣的特性和有序的相，包括常规的超导性，电荷密度的波级和金属-绝缘体的跃迁。角分辨光发射光谱法以及中子和非共振X射线散射都可以用作确定适当的个体自由度（分别为电子结构和晶格激发或声子色散）行为的有效探针。但是，每种方法通常都通过自能量效应提供有关自由度之间相互耦合的较少直接信息，这往往会在强耦合的地方精确地重新规范化和扩宽光谱特征，从而影响人们定量表征耦合的能力。在这里，我们证明了共振非弹性x射线散射或RIXS可以是直接确定凝聚态系统中电子-声子耦合的相对强度和动量依赖性的有效工具。使用图解法对八波段的氧化铜模型进行研究，我们研究了最低阶图对真实散射几何结构对整个RIXS强度的贡献，并考虑了散射截面中的矩阵元素效应以及电子-声子耦合顶点的动量依赖性。对这些图的详细检查为电子声子耦合的特性提供了独特的视角，该特性补充了中子和非共振X射线散射以及拉曼和红外电导率。

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