...
首页> 外文期刊>Journal of Materials Science and Chemical Engineering >Study of Quantitative and Qualitative Characteristics of Nickel Clusters and Semiconductor Structures
【24h】

Study of Quantitative and Qualitative Characteristics of Nickel Clusters and Semiconductor Structures

机译:镍团簇和半导体结构的定量和定性特性研究

获取原文
           

摘要

The possibility of building of clusters of impurity atoms of Ni in silicon and controlling their parameters is currently investigated in the present research article. Our group develops a special technique for doping, the so-called “low-temperature doping” of semiconductors. This method of doping is based upon the diffusion process which is carried out in stages by gradually increasing temperature ranging from room temperature to the diffusion temperature.
机译:目前在本研究文章中研究了在硅中建立Ni的杂质原子簇并控制其参数的可能性。我们的小组开发了一种特殊的掺杂技术,即半导体的“低温掺杂”。这种掺杂方法基于扩散过程,该扩散过程是通过逐渐增加从室温到扩散温度的温度来分阶段进行的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号