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Molybdenum trioxide thin film recombination barrier layers for dye sensitized solar cells

机译:染料敏化太阳能电池用三氧化钼薄膜复合阻挡层

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A physical vapor deposition based molybdenum trioxide (MoO3) thin film is demonstrated as an efficient reverse-electron recombination barrier layer (RBL) at the fluorine doped tin oxide (FTO)/titanium dioxide (TiO2) interface in dye sensitized solar cells (DSSCs). Thin films of MoO3 show an average optical transmittance of ~77% in a spectral range of 350–800 nm with bandgap value of ~3.1 eV. For an optimum thickness of MoO3, deposited for 5 minutes, the resulting DSSCs showed 15% enhancement in efficiency (η) compared to the reference DSSC which did not use MoO3 RBL; this suggests that MoO3 is effectively suppressing interfacial recombination at the FTO/TiO2 interface. Further, increasing the thickness of MoO3 RBL at the FTO/TiO2 interface (20 minutes deposition) is observed to impede charge transport, as noticed with 55% reduction in η compared to the reference DSSC. Thin film MoO3 RBL with an optimum thickness value at the FTO/TiO2 interface efficiently blocks the leaky transport pathways in the mesoporous TiO2 nanoparticle layer and facilitates efficient charge transport as confirmed by electrochemical impedance spectroscopy.
机译:基于物理气相沉积的三氧化钼(MoO 3 )薄膜被证明是掺氟氧化锡(FTO)上的高效反向电子复合阻挡层(RBL)染料敏化太阳能电池(DSSC)中的二氧化钛(TiO 2 )界面。 MoO 3 薄膜在350-800 nm光谱范围内的平均光透射率为〜77%,带隙值为〜3.1 eV。对于沉积5分钟的最佳厚度的MoO 3 ,与参考相比,所得DSSC的效率(η)提高了15%不使用MoO 3 RBL的DSSC;这表明MoO 3 在FTO / TiO 2 界面处有效地抑制了界面复合。此外,在FTO / TiO 2 界面(沉积20分钟)增加MoO 3 RBL的厚度是与参考DSSC相比,η减少了55%,这表明电荷阻碍了电荷的传输。在FTO / TiO 2 界面处具有最佳厚度值的薄膜MoO 3 RBL有效地阻止了泄漏的传输介孔TiO 2 纳米颗粒层中的分子通道,并通过电化学阻抗谱证实了有效的电荷传输。

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