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APS -APS March Meeting 2017 - Event - Dielectric Integration in Transition Metal Dichalcogenides Field-Effect Transistors

机译:APS -APS 2017年3月会议-活动-过渡金属二硫属化物场效应晶体管中的介电集成

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Dielectric plays a crucial role for the scattering of charge carriers two-dimensional transition metal dichalcogenides (TMDs) field-effect transistor channels. The role of various sources of scattering originating from the substrate and the channel/substrate interface such as charged impurities, charge traps, surface roughness, and remote surface optical phonons could be equally important for device performance. On the other hand, miniaturization of device causes the short channel effect. Using high-k dielectric is the proposed solution in this direction but the challenges of high-k dielectric synthesis/growth are important problems to fabricate scalable devices in future electronics. In this work, we will discuss the unique method for the synthesis of high--k dielectric and TMDs field-effect transistor fabrication {&} characterization by using prepared dielectric.
机译:介电体对电荷载流子的二维过渡金属二卤化物(TMD)场效应晶体管沟道的散射起着至关重要的作用。源自衬底和通道/衬底界面的各种散射源(例如带电杂质,电荷陷阱,表面粗糙度和远程表面光子)的作用对于设备性能同样重要。另一方面,装置的小型化导致短沟道效应。在此方向上,建议使用高k电介质解决方案,但是高k电介质合成/生长的挑战是在未来电子产品中制造可扩展器件的重要问题。在这项工作中,我们将讨论使用准备好的电介质来合成高k电介质和TMDs场效应晶体管制造{&}表征的独特方法。

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