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首页> 外文期刊>Bulletin of the American Physical Society >APS -APS March Meeting 2017 - Event - Surface roughness scattering in multisubband accumulation layers
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APS -APS March Meeting 2017 - Event - Surface roughness scattering in multisubband accumulation layers

机译：APS -APS 2017年3月会议-活动-多子带累积层中的表面粗糙度散射

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Accumulation layers with very large concentrations of electrons where many subbands are filled became recently available due to ionic liquid and other new methods of gating. The low temperature mobility in such layers is limited by the surface roughness scattering. However theories of roughness scattering so far dealt only with the small-density single subband two-dimensional electron gas (2DEG). Here we develop a theory of roughness-scattering limited mobility for the multisubband large concentration case. We show that with growing 2D electron concentration $n$ the surface dimensionless conductivity $sigma/(2e^2/h)$ first decreases as $propto n^{-6/5}$ and then saturates as $sim(da_B/Delta^2)gg 1$, where $d$ and $Delta$ are the characteristic length and height of the surface roughness, $a_B$ is the effective Bohr radius. This means that in spite of the shrinkage of the 2DEG width and the related increase of the scattering rate, the 2DEG remains a good metal. Thus, there is no re-entrant metal-insulator transition at high concentrations.
机译：由于离子液体和其他新的选通方法，具有许多子带被填充的具有非常高的电子浓度的累积层最近变得可用。这种层中的低温迁移率受到表面粗糙度散射的限制。然而，到目前为止，粗糙度散射的理论仅涉及小密度单子带二维电子气（2DEG）。在这里，我们针对多子带大浓度情况开发了一种粗糙度散射有限迁移率的理论。我们表明，随着二维电子浓度$ n $的增大，表面无量纲电导率$ sigma /（2e ^ 2 / h）$首先以$ propto n ^ {-6/5} $的形式减小，然后以$ sim（da_B / Delta ^ 2）gg 1 $，其中$ d $和$ Delta $是表面粗糙度的特征长度和高度，$ a_B $是有效玻尔半径。这意味着尽管2DEG宽度减小并且散射速率相应增加，但2DEG仍然是一种良好的金属。因此，在高浓度下没有凹角金属-绝缘体的转变。

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