Tomography of the modulus and phase of an infrared focused beam for nanophotonic characterization measurements

M.Silva-López; J.M.Rico-García; J.Alda

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Tomography of the modulus and phase of an infrared focused beam for nanophotonic characterization measurements

机译：用于纳米光调表征测量的红外聚焦光束的模量和相位的层析成像

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The amplitude and phase spatial maps around the focal plane of a laser beam are recovered.Irradiance maps are obtained using a tomographic method based on the knife‐edge technique, andthe beam phase is obtained by means of an algorithm based on the Irradiance Transport Equation(ITE). Information on the amplitude and phase distribution of an incoming beam is useful forcharacterization of nanophotonic devices (such as antenna‐couple detectors) that are sensitive tothese parameters. This method avoids the use of image‐forming devices which are not suitable underlow spatial resolution conditions.

机译：恢复激光束的焦平面周围的幅度和相空间映射。使用基于刀刃技术的断层法获得物质映射，并且通过基于辐照传输方程的算法获得光束阶段（ ITE）。关于入射光束的幅度和相位分布的信息是有用的纳米光电装置（例如天线夫妇探测器）的特征，其是敏感的达到参数。该方法避免使用不适合的图像形成装置，该装置是不适合的下部空间分辨率条件。

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《Optica pura y aplicada》 |2012年第2期|共5页
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M.Silva-López; J.M.Rico-García; J.Alda;
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Tomography of the modulus and phase of an infrared focused beam for nanophotonic characterization measurements

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