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首页> 外文期刊>Scanning >Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural Paintings
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Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural Paintings

机译：新型TEM显微镜和电子衍射技术，表征文化遗产材料：从古希腊艺术品到玛雅壁画

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摘要

To understand in-depth material properties, manufacturing, and conservation in cultural heritage artefacts, there is a strong need for advanced characterization tools that enable analysis down to the nanometric scale. Transmission electron microscopy (TEM) and electron diffraction (ED) techniques, like 3D precession electron diffraction tomography and ASTAR phase/orientation mapping, are proposed to study cultural heritage materials at nanoscale. In this work, we show how electron crystallography in TEM helps to determine precise structural information and phase/orientation distribution of various pigments in cultural heritage materials from various historical periods like Greek amphorisks, Roman glass tesserae, and pre-Hispanic Maya mural paintings. Such TEM-based methods can be an alternative to synchrotron techniques and can allow distinguishing accurately different crystalline phases even in cases of identical or very close chemical compositions at the nanometric scale.
机译：为了了解文化遗产的深入材料性质，制造和保护，对高级表征工具有很强的需求，使得能够分析到纳米级。提出了透射电子显微镜（TEM）和电子衍射（ED）技术，如3D进出电子衍射断层扫描和astar相位/取向映射，以研究纳米级的文化遗产。在这项工作中，我们展示了TEM中的电子晶体学有助于确定文化遗产材料中各种颜料的精确结构信息和相位/取向分布，从各种历史时期，罗马玻璃Tosserae和前西班牙玛雅玛雅壁画等各种历史时期。这种基于TEM的方法可以是同步rotron技术的替代方案，并且可以允许在纳米级的相同或非常紧密的化学组合物的情况下允许甚至可以区分精确不同的结晶相。

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