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首页> 外文期刊>Detection >Analysis of Nuclear Track Parameters of CN-85 Detector Irradiated to Thermal Neutrons by Using MATLAB Program
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Analysis of Nuclear Track Parameters of CN-85 Detector Irradiated to Thermal Neutrons by Using MATLAB Program

机译：使用MATLAB计划对热中子辐射的CN-85检测器的核轨道参数分析

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CN-85 detector which covered with boric acid H3Bo3 pellete has been irradiated by thermal neutrons from (241Am-9Be) source with activity 12 Ci and neutron flux 105 n. cm-2. s-1. The irradiation times-TD for detector were 4 h, 8 h, 16 h and 24 h. The track detector has been etched with sodium hydroxide. After chemical etching of the irradiated CN-85 detector, the images have been taken from a digital camera connected to the optical microscope. Image processing for the output images has been performed using MATALB program, and these images were analyzed and we had found the following relations: a) The relation between summation of opened track or surface density for tracks (intensity-IT) varies with radius of opening (track radius-RT). b) The relation between the tracks number-NT varies with the tracks diameter-DT (in micrometer) and tracks area-AT. That analysis of image processing was obtained, and the track intensity-IT was decreased with increase of track radius-RT at all of the irradiation time-TD. And the track intensity-IT was increased with increasing irradiation time-TD (h) for different track radius-RT (0.4225, 0.845, 1.2675 and 1.69 μm). The study indicates the possibility of using the analysis of image processing to CN-85 detector for classification of α-particle emitters through limitation of radius of track-RT, in addition to the contribution of these techniques in preparation of nano-filters and nono-membrane in nanotechnology fields.
机译：用硼酸H3BO3凹陷覆盖的CN-85检测器已经通过来自（241AM-9BE）源的热中子，活性12 CI和中子通量105N辐射。 CM-2。 S-1。检测器的照射时间-TD为4小时，8小时，16小时和24小时。用氢氧化钠蚀刻轨道检测器。在辐照的CN-85检测器的化学蚀刻之后，从连接到光学显微镜的数码相机中取出图像。已经使用MATALB程序执行了输出图像的图像处理，并分析了这些图像，我们已经发现了以下关系：a）轨道（强度 - IT）的开放轨道或表面密度的求和之间的关系随开口半径而变化（跟踪半径-T-RT）。 b）轨道编号-NT之间的关系随着轨道直径-DT（MIGROMS）和轨道区域的关系而变化。获得了图像处理的分析，并且随着轨道半径-TT在所有照射时间-TD的增加而降低轨道强度 - 它降低。随着不同轨道半径-TT（0.4225,0.845,1.2675和1.69μm）的辐射时间Td（h）增加，轨道强度 - 随着辐照时间-Td（h）增加。该研究表明，除了在制备纳米过滤器的贡献和非纳米滤波器和非纳米滤波器和非纳米滤波器和非轨道的贡献之外，可以使用对CN-85检测器的图像处理分析到CN-85检测器的可能性。纳米技术领域的膜。

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