• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>IEEE Transactions on Dielectrics and Electrical Insulation >The investigation and improvement of the lifetime of high voltage ceramic capacitor under repetitive frequency operation
【24h】

The investigation and improvement of the lifetime of high voltage ceramic capacitor under repetitive frequency operation

机译：重复频率工作下高压陶瓷电容器寿命的研究与改进

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

The lifetime tests for High Voltage Ceramic Capacitors (HVCC) were investigated under repetitive frequency operation at 25 Hz and three kinds of failure modes were summarized. The significant innovation of this paper is testing HVCC, made in the laboratory, under repetitive pulses and proposing several effective improvement methods. The results show that the lifetime of HVCC meets inverse power-law with the applied voltage and the voltage acceleration factor is about 5.8. Failure modes of HVCC are inner breakdown of ceramic dielectric, interface breakdown of ceramic-epoxy and abscission of brass terminals. The inner breakdown is in connection with abrupt destructive discharge under much higher stress while the interface breakdown is related to interface delamination and development of electrical trees in relatively low strength. The third failure mode is always caused by high current density. Based on the failure modes, several methods were taken to improve the performance of HVCC, which included coating semiconductor at the edge of silver layers, adding coupling agent to ceramic-epoxy interface and improving the structure of brass terminals. The lifetime of HVCC under repetitive frequency operation has been extended greatly from 10 shots to more than 10 shots after the investigation and improvement.
机译：研究了在25 Hz重复频率下高压陶瓷电容器（HVCC）的寿命测试，总结了三种故障模式。本文的重大创新是在重复脉冲下测试实验室制造的HVCC，并提出几种有效的改进方法。结果表明，在施加电压的条件下，HVCC的寿命符合逆幂律，电压加速因子约为5.8。 HVCC的失效模式是陶瓷电介质的内部击穿，陶瓷环氧树脂的界面击穿和黄铜端子的脱落。内部击穿与在高得多的应力下的突然破坏性放电有关，而界面击穿与相对较低强度的电树的界面分层和发展有关。第三种故障模式总是由高电流密度引起的。根据失效模式，采取了几种方法来提高HVCC的性能，包括在银层边缘涂覆半导体，在陶瓷-环氧树脂界面中添加偶联剂以及改善黄铜端子的结构。经过研究和改进，HVCC在重复频率操作下的使用寿命已从10发大大延长到10发以上。

著录项

  • 来源
  • 作者

    Jiaqi Yan; Weidong Ding; Wei Duan; Yanan Wang; Yang Gou; Siyu Zhang; Kaiyang Qian; Jiachen Wang; Pengcheng Wang;

  • 作者单位

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    State Grid Shaanxi Electric Power Research Institute, Xi'an, Shannxi 710054, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    Xi'an Jiaotong University, State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an, Shannxi 710049, China;

    State Grid Liaoning Electric Power Company, Shenyang, Liaoning 110000, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Capacitors; Ceramics; Testing; Lifetime estimation; Discharges (electric); Electric fields;

    机译：电容器;陶瓷;测试;寿命估算;放电（电）;电场;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号