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Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - application to practical diverse waveforms

机译:基于新的基本曲线拟合方法评估雷电冲击耐受电压测试波形的过冲率-在实际各种波形中的应用

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摘要

In a lightning impulse withstand voltage test for large-sized electric power equipment, voltage waveforms sometimes contain overshoot due to the capacitance of the test equipment and the residual inductance of the test circuit. The authors have been studying fitting methods for extracting a reasonable base curve from this overshoot waveform and constructed a new base curve extraction method. In this paper, a verification study was performed using diverse overshoot waveforms to show the rationality of this new method from a more practical perspective. To be specific, the study used actual waveforms with the frequency of the overshoot part varied as well as waveforms with the overshoot rate less than 10%. Consequently, it was found that the new method was a more reasonable one to calculate the overshoot rate of several to several tens of percent which is an actual range for evaluation in the test. Meanwhile, it should be noted that the k-factor filtering scheme was implemented after the application of various fitting methods to test data generator waveforms, and then the shape parameters of the test voltage waveforms, such as the crest value, front time, and time to half-value, were almost identical, which confirmed that fitting methods had only a minor influence on the test voltage waveform. Furthermore, assuming an actual test for UHV-class equipment, the relationship between the front time and the overshoot rate was investigated in detail. As a result, it emerged that, although it was difficult to generate waveforms complying with the present standard if the capacitance of the test equipment was large, the number of equipment that could comply with the standard would significantly increase if the value of standard for the front time was relaxed.
机译:在大型电力设备的雷电冲击耐压测试中,由于测试设备的电容和测试电路的残留电感,电压波形有时会包含过冲。作者一直在研究从过冲波形中提取合理的基础曲线的拟合方法,并构建了一种新的基础曲线提取方法。在本文中,使用不同的过冲波形进行了验证研究,以从更实际的角度显示此新方法的合理性。具体来说,该研究使用了具有过冲部分频率变化的实际波形以及过冲率小于10%的波形。因此,发现该新方法是一种更合理的方法,它可以计算百分之几到百分之几十的过冲率,这是测试中评估的实际范围。同时,应该注意的是,k因子滤波方案是在应用各种拟合方法来测试数据生成器波形之后,然后是测试电压波形的形状参数(例如波峰值,前沿时间和时间)实施的。到一半的值几乎是相同的,这证实了拟合方法对测试电压波形的影响很小。此外,假设对UHV级设备进行了实际测试,则详细研究了前置时间与过冲率之间的关系。结果表明,尽管如果测试设备的电容较大,则很难生成符合当前标准的波形,但如果用于测试的设备的标准值较大,则可以符合该标准的设备数量将大大增加。前台时间很轻松。

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