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Analysis of formulas to calculate the AC resistance of different conductors' configurations

机译：分析用于计算不同导体配置的交流电阻的公式

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摘要

Skin and proximity effects in single- or multi-conductor systems can notoriously affect the AC resistance in conductors intended for electrical power transmission and distribution systems and for electronic devices. This increase of the AC resistance raises power loss and limits the conductors' current-carrying capacity, being an important design parameter. There are some internationally recognized exact and approximated formulas to calculate the AC resistance of conductors, whose accuracy and applicability is evaluated in this paper. However, since these formulas can be applied under a wide range of configurations and operating conditions, it is necessary to evaluate the applicability of these models. This is done by comparing the results that they provide with experimental data and finite element method (FEM) simulation results. The results provided show that FEM results are very accurate and more general than those provided by the formulas, since FEM models can be applied to a wide range of conductors' configurations and electrical frequencies. (C) 2015 Elsevier B.V. All rights reserved.
机译：众所周知，单导体或多导体系统中的趋肤效应和邻近效应会影响旨在用于电力传输和分配系统以及电子设备的导体中的交流电阻。交流电阻的增加会增加功率损耗并限制导体的载流能力，这是重要的设计参数。有一些国际公认的精确和近似公式可以计算导体的交流电阻，本文对它们的准确性和适用性进行了评估。但是，由于这些公式可以在广泛的配置和操作条件下应用，因此有必要评估这些模型的适用性。通过将它们提供的结果与实验数据和有限元方法（FEM）仿真结果进行比较，可以完成此操作。所提供的结果表明，有限元方法的结果比公式提供的结果更为准确和笼统，因为有限元模型可以应用于各种导体结构和电频率。 （C）2015 Elsevier B.V.保留所有权利。

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