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A new accelerated aging procedure for cable life tests

机译:用于电缆寿命测试的新的加速老化程序

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摘要

A new accelerated aging procedure for cable life tests has been proposed in this paper. The objective has been to minimize the total test costs using cable samples subject to the constraint that all relavant cable characteristics should be preserved by the samples. The procedure utilizes a combined approach based on available physical and mathematical models and laboratory accelerated aging tests. The behavior of dielectric strength, dielectric loss angle, capacitance and loss of mass in XLPE cable models subjected to different aging conditions (voltages and temperatures) has been monitored in order to verify the proposed procedure. Investigations have proven that the results concerning aging effects obtained under combined stresses (simultaneously electrical and thermal) are different from those obtained under single-stress aging. The degradations caused by combined stresses cannot be directly related to the changes caused by the single stress, i.e. their superposition is not valid. It has been found that tan delta can serve as a representative indicator of other cable properties relevant to aging phenomena.
机译:本文提出了一种用于电缆寿命测试的新的加速老化程序。目的是使电缆样本的总测试成本最小化,但要受所有样本应保留所有相关电缆特性的限制。该程序利用基于可用物理和数学模型以及实验室加速老化测试的组合方法。 XLPE电缆模型在不同老化条件(电压和温度)下的介电强度,介电损耗角,电容和质量损失的行为已得到监控,以验证所提出的程序。研究证明,在组合应力(同时具有电和热)下获得的关于老化效应的结果与在单应力老化下获得的结果不同。由组合应力引起的降级不能直接与由单个应力引起的变化直接相关,即它们的叠加是无效的。已经发现,tanδ可以用作与老化现象有关的其他电缆特性的代表指标。

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