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A Study of Accelerated Life Test of White OLED Based on Maximum Likelihood Estimation Using Lognormal Distribution

机译:基于对数正态分布的最大似然估计的白色OLED加速寿命试验研究

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摘要

In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law.
机译:本文对白色有机发光二极管(WOLED)进行了加速寿命测试,以获取正常工作条件下的故障数据。对数正态分布函数用于描述WOLED寿命分布。通过最大似然估计确定对数平均值和对数标准偏差。进行了Kolmogorov–Smirnov测试,结果进一步证实WOLED寿命符合对数正态分布。数值结果表明,WOLED寿命遵循对数正态分布。还发现加速度模型与逆幂定律一致。

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