Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement

Y. Narayana Rao

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Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement

机译：对介电击穿，高压测试和测量领域的研究贡献

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The paper contains brief details of the research work carried out under the Author's guidance spread over a period of 28 years at the Indian Institute of Technology (IIX), Madras, which he joined soon after completing his doctorate at the Technical University of Braunschweig (TUB) in 1968.

机译：本文包含在印度理工学院（IIX），马德拉斯研究所的28年期间开展的研究工作的简要详细信息，他于在Braunschweig技术大学完成博士后，他很快就加入了（浴缸））1968年。

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《Elektrie》 |2019年第7303期|24-26|共3页
作者
Y. Narayana Rao;
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Dept. of Electrical Engineering Indian Institute of Technology Madras Chennai 600036 India (currently) Emeritus Professor Electrical and Electronics Engineering Dept. Sri Jayachamarajendra College of Engineering Mysore 570006 India;

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1. Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement [J] . Y. Narayana Rao Elektrie . 2021,第9050a9055期

机译：对介电击穿，高压测试和测量领域的研究贡献
2. Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement [J] . Y. Narayana Rao Elektrie . 2018,第5624a5629期

机译：对介电击穿，高压测试和测量领域的研究贡献
3. Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement [J] . Y. Narayana Rao Elektrie . 2017,第4010a4015期

机译：对介电击穿，高压测试和测量领域的研究贡献
4. Space charge measurements, dielectric spectroscopy and breakdown tests on new and aged polycarbonate HVDC insulating materials [C] . Alijagic-Jonuz, B., Morshuis, Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04 . 2004

机译：在新的和老化的聚碳酸酯HVDC绝缘材料上进行空间电荷测量，介电谱和击穿测试
5. High-voltage subnanosecond dielectric breakdown. [D] . Mankowski, John Jerome. 1997

机译：高压亚纳秒电介质击穿。
6. A Laboratory Test Setup for in Situ Measurements of the Dielectric Properties of Catalyst Powder Samples under Reaction Conditions by Microwave Cavity Perturbation: Set up and Initial Tests [O] . Markus Dietrich, Dieter Rauch, Adrian Porch, 2014

机译：通过微波腔扰动在反应条件下原位测量催化剂粉末样品介电性能的实验室测试装置：设置和初始测试
7. Time-Dependent Dielectric Breakdown in High-Voltage GaN MIS-HEMTs: The Role of Temperature [O] . Shireen Warnock, Allison Lemus, Jungwoo Joh, 2017

机译：高压GaN MIS-HEMT中的时间依赖介电击穿：温度的作用
8. Semiconductor Measurement Technology:Suppression of Premature Dielectric Breakdown for High-Voltage Capacitance Measurements. [R] . goodman,alvin m. 1977

机译：半导体测量技术：抑制高压电容测量的过早介电击穿。

Research Contributions to the Areas of Dielectric Breakdown, High-Voltage Testing and Measurement

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