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首页> 外文期刊>Environmental Science & Technology >Scanning Electron Microanalysis and Analytical Challenges of Mapping Elements in Urban Atmospheric Particles
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Scanning Electron Microanalysis and Analytical Challenges of Mapping Elements in Urban Atmospheric Particles

机译：扫描电子显微分析和城市大气颗粒物中映射元素的分析挑战

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摘要

Elemental mapping with energy-dispersive X-ray spectroscopy (EDX) associated with scanning electron microscopy is highly useful for studying internally mixed atmospheric particles. Presented is a study of individual particles from urban airsheds and the analytical challenges in qualitatively determining the composition and origin of heterogeneous urban-air particles from high-resolutionelemental maps. Coarse-mode particles were taken from samples collected in three U.S. cities: Atlanta, Los Angeles, and Seattle. Elemental maps distinguished particles with heterogeneously mixed hases from those with homogeneously mixed phases that also contained inclusions or surface adducts. Elemental mapping at low and high beam energies, along with imaging at an oblique angle helped to classify particles by origin. The impact of particle shape on X-ray microanalysis was demonstrated by having the beam enter the particle at > 52° from normal Potential misinterpretations of particle composition due to artifacts in the elemental maps were minimized by tilt imaging to reveal particle surface roughness and depth, mapping at low beam energies, noting the position of the EDX detector in the map field, and assessing differences in the mass absorption coefficients of the particle's major elements to anticipate X-ray self-absorption.
机译：与扫描电子显微镜相关的能谱X射线能谱仪（EDX）进行元素映射对于研究内部混合的大气颗粒非常有用。提出的是对来自城市流域的单个颗粒的研究，以及在从高分辨率元素地图定性确定异质城市空气颗粒的组成和来源方面的分析挑战。粗模式粒子是从美国三个城市（亚特兰大，洛杉矶和西雅图）收集的样本中获取的。元素图区别了具有异质混合混合颗粒的颗粒和具有均质混合相的颗粒，其中还包含夹杂物或表面加合物。在低和高束能量下的元素映射以及倾斜角度的成像有助于按来源对粒子进行分类。粒子形状对X射线微分析的影响通过以下方式证明：光束从正常角度> 52°进入粒子。通过倾斜成像最大限度地减少了元素图谱中由于伪影而造成的粒子成分误解，以揭示粒子表面的粗糙度和深度，在低束能量下进行图谱绘制，注意EDX检测器在图场中的位置，并评估粒子主要元素的质量吸收系数之间的差异，以预测X射线的自吸收。

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  • 来源
    《Environmental Science & Technology》 |2011年第17期|p.7380-7386|共7页
  • 作者

    Joseph M. Conny; Gary A. Norris;

  • 作者单位

    Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899,United States;

    National Exposure Research Laboratory, U.S. Environmental Protection Agency, Research Triangle Park, North Carolina 27711,United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
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  • 正文语种 eng
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