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首页> 外文期刊>Environmental Science & Technology >Model bacterial extracellular polysaccharide adsorption onto silica and alumina: Quartz crystal microbalance with dissipation monitoring of dextran adsorption
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Model bacterial extracellular polysaccharide adsorption onto silica and alumina: Quartz crystal microbalance with dissipation monitoring of dextran adsorption

机译：模拟细菌细胞外多糖在二氧化硅和氧化铝上的吸附：具有葡聚糖吸附耗散监测功能的石英晶体微量天平

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摘要

Quartz crystal microbalance with dissipation monitoring (QCM-D) was used to investigate dextran adsorption to alumina and silica. Sensitive adsorption measurements combined with determination of nanometer-scale polymer conformations demonstrate the utility of this technique for studying biopolymer adsorption. The adsorbed amounts and polymeric structures of dextran were determined on Al2O3 and SiO2 by real-time monitoring of resonance frequency and energy dissipation changes (Delta f and Delta D). After the sample was rinsed, the apparent mass of retained dextran was 83 ng/cm(2) on the alumina surface and 9 ng/cm(2) on the silica surface based on the frequency and energy dissipation changes. The Delta D/Delta f ratios were significantly different on the two surfaces, indicating different conformations of the polymers. On alumina, the ratio changed as adsorption proceeded indicating changes of dextran conformation from the initial to latter adsorption steps. On silica, the ratio did not change during the experiments. Therefore, the dissipation and frequency data suggest significantly different mechanisms of dextran adsorption on alumina and silica surfaces. Molecular dynamics simulations of 12 monomeric units of dextran on a silica slab illustrated that H2O molecules lead to loosely bound dextran structure onto the SiO2 surface, consistent with the observed high-energy dissipation in the QCM-D experiments.
机译：带有耗散监测的石英晶体微天平（QCM-D）用于研究葡聚糖对氧化铝和二氧化硅的吸附。灵敏的吸附测量与确定纳米级聚合物构象的结合证明了该技术在研究生物聚合物吸附方面的实用性。通过实时监测共振频率和能量耗散变化（Δf和Delta D），确定Al2O3和SiO2上葡聚糖的吸附量和聚合物结构。冲洗样品后，根据频率和能量耗散的变化，表观质量的右旋糖酐在氧化铝表面的表观质量为83 ng / cm（2），在二氧化硅表面的表观质量为9 ng / cm（2）。在两个表面上的Delta D / Delta f比值显着不同，表明聚合物的构象不同。在氧化铝上，该比率随吸附的进行而变化，表明葡聚糖构象从最初的吸附步骤到随后的吸附步骤都发生了变化。在二氧化硅上，该比例在实验过程中没有改变。因此，耗散和频率数据表明右旋糖酐在氧化铝和二氧化硅表面的吸附机理显着不同。在硅胶板上对12个葡聚糖单体单元的分子动力学模拟表明，H2O分子导致葡聚糖结构松散结合在SiO2表面上，这与QCM-D实验中观察到的高能耗散一致。

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