...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Generation, Transmission & Distribution, IET >Overhead line design considerations for conductor creep mitigation
【24h】

Overhead line design considerations for conductor creep mitigation

机译：减轻导线蠕变的架空线设计注意事项

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Utilities are continuously investigating methods to economically reinforce their overhead line (OHL) networks by reconductoring with larger conductors or with novel high-temperature low-sag (HTLS) conductor technologies. To further optimise the OHL design, conductor creep ageing is calculated and mitigated at installation, which economically improves an OHLs' performance. An already established methodology is used to investigate common and HTLS conductors ageing effect on sag and tension in order to highlight the benefits and risks that could result from existing creep mitigation methods particularly on HTLS conductors. The study aims to identify the impact of important design factors such as ice loading and emergency operation events and their frequency of occurrence on creep mitigation as well as to highlight the creep variation of the same materials used particularly on different HTLS conductors. The analysis presented here indicates that pre-tensioning could be more beneficial on soft aluminium HTLS conductors while over-tensioning can result in extensive durations of conductor over-stressing on steel supported and Gap-type conductors. Furthermore, the conductor technology majorly affects the creep of steel core which cannot be considered always as zero. The accuracy of the methodology is also re-validated using recent experimental data from Gap conductor.
机译：公用事业公司正在不断研究通过与大型导体或新型高温低陷（HTLS）导体技术进行导通来经济地增强其架空线（OHL）网络的方法。为了进一步优化OHL设计，可以计算并减轻安装时导体的蠕变老化，从经济上提高OHL的性能。使用一种已经建立的方法来研究普通和HTLS导体老化对松弛和张力的影响，以强调现有的蠕变缓解方法（尤其是HTLS导体）可能带来的好处和风险。这项研究旨在确定重要的设计因素（如冰负荷和紧急运行事件及其发生的频率）对缓解蠕变的影响，并着重强调特别是在不同HTLS导体上使用的相同材料的蠕变变化。此处进行的分析表明，预紧可能对软质铝HTLS导体更有利，而过度张紧会导致钢支撑和间隙型导体上的导体过长的应力持续时间。此外，导体技术会严重影响钢芯的蠕变，而不能始终将其视为零。使用来自Gap导体的最新实验数据也重新验证了该方法的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号