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首页> 外文期刊>IEEE Geoscience and Remote Sensing Letters >A Microwave Tomographic Approach for Nondestructive Testing of Dielectric Coated Metallic Surfaces
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A Microwave Tomographic Approach for Nondestructive Testing of Dielectric Coated Metallic Surfaces

机译：微波层析成像方法用于介电涂层金属表面的无损检测

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摘要

A microwave imaging method for nondestructive testing of perfectly conducting surfaces beyond a layered media is presented. The method is an adaptation of the surface reconstruction approach by Yapar to the present problem. It is based on the analytical continuation of the measured data to the surface under test through a special representation of the scattered field in terms of Fourier transform and Taylor expansion. Then the problem is reduced to the solution of a nonlinear equation which is solved iteratively via the Newton method and regularization in the least squares sense. Numerical simulations show that defects as small as $ lambda/500$ can be recovered through the presented algorithm.
机译：提出了一种微波成像方法，用于对分层介质之外的完美导电表面进行无损检测。该方法是Yapar的表面重建方法对当前问题的适应。它基于通过傅立叶变换和泰勒展开对散射场的特殊表示，将测得数据到被测表面的分析连续性。然后将问题简化为非线性方程的解，该非线性方程通过牛顿法和最小二乘正则化进行迭代求解。数值模拟表明，通过所提出的算法，可以修复低至$λ/ 500 $的缺陷。

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