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Modern Control and Industrial Electronics 2016: For Future Development

机译:2016年现代控制与工业电子:面向未来发展

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The Workshop on Modern Control and Industrial Electronics 2016 (MCIE) was held in Harbin, China, 19?20 January 2016 (Figure 1). MCIE 2016 was technically sponsored by the IEEE Industrial Electronics Society (IES) Technical Committee on Data-Driven Control and Monitoring. It was organized by the Research Institute of Intelligent Control and Systems of Harbin Institute of Technology (HIT) and the IES and IEEE Systems, Man, and Cybernetics Society Harbin Chapters. The workshop provided a wide platform for HIT students and researchers to learn the latest research results and exchange ideas with top-level researchers in the field of control and power electronics worldwide. The workshop enhanced the influence of IES at HIT as well as in northeast China. Around 150 researchers and students from different Chinese universities attended the workshop. Five world-renowned scientists were invited to deliver plenary talks:
机译:2016年现代控制与工业电子研讨会(MCIE)于2016年1月19日至20日在中国哈尔滨举行(图1)。 MCIE 2016由IEEE工业电子学会(IES)数据驱动控制和监视技术委员会技术赞助。它是由哈尔滨工业大学智能控制与系统研究所(HIT)以及IES和IEEE系统,人类与控制论学会哈尔滨分会组织的。研讨会为HIT学生和研究人员提供了广泛的平台,以学习最新的研究成果并与全球控制和电力电子领域的顶级研究人员交流思想。该研讨会增强了IES在HIT和东北地区的影响力。来自中国不同大学的约150名研究人员和学生参加了研讨会。邀请了五位世界知名的科学家进行全体演讲:

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