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机译:SI的高性能成像验证:P用于非常长波红外光谱范围的杂质带探测器
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
Shanghai Inst Microsyst & Informat Technol Shanghai 200050 Peoples R China|Univ Chinese Acad Sci Beijing 100049 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
China Elect Technol Grp Corp Res Inst 50 Shanghai 200331 Peoples R China;
Detectors; Absorption; Imaging; Impurities; Silicon; Doping; Conductivity; Photodetectors; silicon-based blocked-impurity-band detector; optical imaging; VLWIR;
机译:阻挡层和阳极偏压在基于GaAs的阻挡杂质带检测器的杂质带跃迁和传输过程中的作用
机译:阻塞层和阳极偏压在基于GaAs的阻塞 - 杂质带探测器的杂质带转换过程中的作用
机译:基于块的融合模拟带生成算法,用于部分不同波长范围的高光谱和多光谱图像
机译:用于探测器光谱校准的NIST设施:砷掺杂的硅阻挡杂质带探测器的校准
机译:锗远红外阻挡杂质带检测器。
机译:使用光谱分辨探测器阵列的荧光高光谱成像(fHSI)
机译:基于SI的阻塞 - 杂质带红外检测材料和探测器的研究进展
机译:镓掺杂硅阻挡杂质带探测器