The first electro-optic measurement of a monolithic antenna near-field is presented. A 10-GHz monolithic slot antenna is designed and precisely characterized by Electro-Optic Sampling (EOS). The fringing effect of a shorted slot and the influence of undesirable modes on the antenna's near field can be measured accurately. Therefore, the EOS technique is very effective for on-wafer measurement and the development of monolithic antennas.
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