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Monolithic circuit for reflection coefficient measurement

机译:用于反射系数测量的单片电路

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摘要

A monolithic circuit for measuring the complex reflection coefficient using fixed-probe voltage sampling has been investigated. Ion-implanted GaAs Schottky diodes, with built-in isolation resistance, have been used as voltage samplers along a microstrip transmission line on semi-insulating GaAs. An algorithm for determining reflection coefficient from three detected DC voltages is described. Circuit analysis and modeling, DC voltage calculations, and experimental results for the 5-18 GHz frequency range are presented.
机译:已经研究了使用固定探针电压采样测量复数反射系数的单片电路。带有内置隔离电阻的离子注入式GaAs肖特基二极管已被用作半绝缘GaAs上微带传输线上的电压采样器。描述了一种根据三个检测到的直流电压确定反射系数的算法。给出了5-18 GHz频率范围的电路分析和建模,直流电压计算以及实验结果。

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