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首页> 外文期刊>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems >Enhancing random-pattern coverage of programmable logic arrays via masking technique
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Enhancing random-pattern coverage of programmable logic arrays via masking technique

机译:通过屏蔽技术增强可编程逻辑阵列的随机模式覆盖范围

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摘要

A testable design of programmable logic arrays (PLAs) with high fault coverage for random test patterns is presented. The proposed design is realized with low area overhead by adding two mask arrays to the AND and OR arrays of the PLA. An experiment was performed to demonstrate the effect of the masking technique. In the experiment, eight large PLAs were modified by adding mask arrays of various sizes; fault simulation with random patterns for modified and unmodified PLAs was then carried out to obtain random-pattern test coverage curves. Fault coverage can be significantly enhanced via the proposed masking technique with very low area overhead.
机译:提出了一种针对随机测试模式具有高故障覆盖率的可编程逻辑阵列(PLA)的可测试设计。通过向PLA的AND和OR阵列添加两个掩码阵列,可以以较低的面积开销实现提出的设计。进行了实验以证明掩蔽技术的效果。在实验中,通过添加各种尺寸的掩模阵列修改了八个大型PLA。然后对修改后的和未修改的PLA进行带有随机模式的故障模拟,以获得随机模式的测试覆盖率曲线。通过提议的掩蔽技术可以以非常低的面积开销显着增强故障覆盖率。

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