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On the Coiflet-TDS Solution for Scattering by Sharp Coated Cones and Its Application to Emissivity Determination

机译:尖锐涂层锥散射的Coiflet-TDS解法及其在发射率测定中的应用

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We report the continuous effects in modeling sharp coated cones as calibration targets by surface integration solutions. The Coiflet based method of moment (MoM) is employed in conjunction with the thin dielectric sheet approximation (TDS). The Coifman wavelets inherit mathematical superiority in the Galerkin procedure, e.g., the high precision one-point quadrature for fast matrix filling, local multi-resolution ability, and high regularity with Hölder index 1.449 in smoothness. Local geometry refinements are implemented to reduce the errors by TDS approximation in modeling very sharp structures. The Coiflet-TDS solution is compared to an in-house FDTD package and good agreement has been observed. The presented MoM is also compared against the RWG-TDS based commercial software FEKO, and the Coiflet-TDS demonstrates more robust in modeling surfaces with sharp geometries. Finally, the emissivity of a calibrator is studied versus directions and polarizations, and its variation trends are observed.
机译:我们报告了通过表面集成解决方案将尖锐涂层圆锥建模为校准目标时的持续影响。基于Coiflet的矩量法(MoM)与薄电介质片近似(TDS)结合使用。 Coifman小波在Galerkin过程中继承了数学上的优势,例如用于快速矩阵填充的高精度单点正交,局部多分辨率能力以及Hölder指数1.449的高规则性。在对非常尖锐的结构进行建模时,通过TDS逼近来实现局部几何优化,以减少误差。将Coiflet-TDS解决方案与内部FDTD软件包进行了比较,并观察到了很好的一致性。还将提出的MoM与基于RWG-TDS的商业软件FEKO进行了比较,并且Coiflet-TDS在建模具有尖锐几何形状的表面时表现出了更高的鲁棒性。最后,研究了校准器的发射率与方向和极化的关系,并观察了其变化趋势。

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