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首页> 外文期刊>Magnetics, IEEE Transactions on >Measurements on Real and Imaginary Parts of Transverse Susceptibility of Particulate System
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Measurements on Real and Imaginary Parts of Transverse Susceptibility of Particulate System

机译：颗粒系统横向磁化率实部和虚部的测量

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摘要

In this paper, the influence of ac field frequency on transverse susceptibility (TS) curves was investigated. Two different experimental setups were used to reach the excitation frequency of 6 GHz. At low frequencies, the real and imaginary parts of the susceptibility were directly obtained by measuring the impedance of a coil incorporating the sample using a RLC bridge. In the microwave frequency domain, the susceptibility was correlated with the scattering parameters of a transmission line containing the sample. The experimental data show that for a Ni-Zn ferrite polycrystalline sample NiZnFeO and for ac field frequencies up to 100 MHz, the TS peeks do not present an important shift in field positions. The measured real and imaginary parts of the TS have the same peek structure, but the amplitude and line width differ. At higher ac frequencies, the peeks field are frequency dependent and a supplementary peek was observed.
机译：本文研究了交流场频率对横向磁化率（TS）曲线的影响。使用两种不同的实验设置来达到6 GHz的激发频率。在低频下，磁化率的实部和虚部可通过使用RLC电桥测量并入样品的线圈的阻抗直接获得。在微波频域中，磁化率与包含样品的传输线的散射参数相关。实验数据表明，对于Ni-Zn铁氧体多晶样品NiZnFeO和高达100 MHz的交流场频，TS偷看不会显示出场位置的重要变化。 TS的实部和虚部具有相同的窥视结构，但幅度和线宽不同。在更高的ac频率下，窥视场与频率有关，并且观察到一个补充窥视。

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