Magnetic Depth Profiling of the Co/C60 Interface Through Soft X-Ray Resonant Magnetic Reflectivity

Verna Adriano; Bergenti Ilaria; Pasquali Luca; Giglia Angelo; Albonetti Cristiano; Dediu Valentin; Borgatti Francesco

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Magnetic Depth Profiling of the Co/C60 Interface Through Soft X-Ray Resonant Magnetic Reflectivity

机译：通过软X射线谐振磁反射率CO / C60接口的磁深度分析

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We have probed the structural and magnetic properties of a ferromagnetic/organic interface constituted by a polycrystalline Co layer deposited on a fullerene thin film through resonant soft X-ray reflectivity measurements. The fitting analysis of the reflectivity indicates the formation of a sharp interface with limited intermixing and a null remanent magnetization in a & x007E;1 nm thick region of the Co film at the interface with C₆₀. This information contributes to elucidate the role of organic & x2013;inorganic interfaces in the charge and spin transport inside organic spintronic devices.

机译：我们探讨了由沉积在富勒烯薄膜上的多晶CO层构成的铁磁/有机界面的结构和磁性通过谐振软X射线反射率测量。反射率的拟合分析表明，在A＆X007E中形成具有有限的混合和零次磁化的尖锐界面;在与C _{60 的界面处的CO膜的1nm厚区域。这些信息有助于阐明有机和X2013的作用;电荷和旋转输送到有机旋转器装置内的无机界面。}

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来源
《IEEE Transactions on Magnetics》 |2020年第5期|1-6|共6页
作者
Verna Adriano; Bergenti Ilaria; Pasquali Luca; Giglia Angelo; Albonetti Cristiano; Dediu Valentin; Borgatti Francesco;
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作者单位

Univ Roma Tre CNISM Dipartimento Sci Rome 00146 Italy;

CNR Ist Studio Mat Nanostrutturati CNR ISMN Bologna 40129 Italy;

Univ Modena & Reggio Emilia Dept Engn E Ferrari Modena 41125 Italy|Univ Johannesburg Dept Phys ZA-2006 Auckland Pk South Africa;

CNR Ist Officina Materiali CNR IOM Trieste 34149 Italy;

CNR Ist Studio Mat Nanostrutturati CNR ISMN Bologna 40129 Italy;

CNR Ist Studio Mat Nanostrutturati CNR ISMN Bologna 40129 Italy;

CNR Ist Studio Mat Nanostrutturati CNR ISMN Bologna 40129 Italy;

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正文语种 eng
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关键词
Cobalt; fullerene; organic-inorganic interface; resonant magnetic scattering; soft X-ray resonant reflectivity;

机译：钴;富勒烯;有机无机界面;谐振磁散射;软X射线共振反射率;

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机译：极化软X射线共振磁反射率探测（Rh / Fe_（1-x）Co_x）_2Rh（001）双层中的非共线磁性分布
2. Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity [J] . J. -M. Tonnerre, E. Jal, E. Bontempi, The European Physical Journal - Special Topics . 2012,第1期

机译：软X射线共振磁反射率在超薄膜中的深度分辨磁化分布
3. Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity [J] . J.-M. Tonnerre, E. Jal, E. Bontempi, The European physical journal: Special topics . 2012,第Null期

机译：软X射线共振磁反射率在超薄膜中的深度分辨磁化分布
4. (07C103) Non-collinear magnetic profile in (Rh/Fe_(1-x)CO_x)/Rh(001 bilayer probed by polarized soft x-ray resonant magnetic reflectivity [C] . M. Przybylski, J.-M. Tonnerre, F. Yildiz Annual Conference on Magnetism and Magnetic Materials . 2012

机译：（07C103）（rh / fe_（1-x）co_x）/ rh（通过偏振软X射线谐振磁反射率探测001双层的非共线磁性分布
5. Ultrafast Dynamics of Magnetic Multilayer Films: Magneto-Optical Spectroscopy and Resonant Scattering in the Extreme Ultraviolet and Soft X-Ray Spectral Regions [D] . Zusin, Dmitriy. 2018

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6. Probing ultrafast changes of spin and charge density profiles with resonant XUV magnetic reflectivity at the free-electron laser FERMI [O] . C. Gutt, T. Sant, D. Ksenzov, 2017

机译：在自由电子激光器FERMI上利用共振XUV磁反射率探测自旋和电荷密度分布的超快变化
7. Toward ultrafast magnetic depth profiling using time-resolved x-ray resonant magnetic reflectivity [O] . Valentin Chardonnet, Marcel Hennes, Romain Jarrier, 2021

机译：使用时间分辨的X射线共振磁反射率朝着超快磁深分析

Magnetic Depth Profiling of the Co/C60 Interface Through Soft X-Ray Resonant Magnetic Reflectivity

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