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首页> 外文期刊>IEEE Transactions on Magnetics >Time-resolved measurement of micro-magnetic field by stroboscopic electron beam tomography
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Time-resolved measurement of micro-magnetic field by stroboscopic electron beam tomography

机译：频闪电子束层析成像技术的时间分辨测量

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摘要

Stroboscopic electron-beam tomography has been achieved for time-resolved measurement of the magnetic recording thin-film head. The transition characteristics of magnetic field distributions were compared; the driving current was found to have a temporal resolution of 1 ns. Both the driving current waveforms and the magnetic field distributions are measured by a pulsed electron beam with the same timing pulse gate. This measurement was successfully applied to Ni-Fe and CoTaZr amorphous thin-film disk heads. It was found that the magnetic field distribution change with time is not uniform and that the peak field is a few nanoseconds behind the driving current for Ni-Fe heads. The frequency characteristics of these heads correspond for the magnetic field delay to the driving current. The frequency characteristics of the head whose magnetic field delay is longer are inferior to those of the head whose magnetic field delay is shorter.
机译：对于磁记录薄膜头的时间分辨测量，已经实现了频闪电子束断层扫描。比较了磁场分布的跃迁特性；发现驱动电流的时间分辨率为1 ns。通过具有相同定时脉冲门的脉冲电子束测量驱动电流波形和磁场分布。该测量成功地应用于Ni-Fe和CoTaZr非晶薄膜磁盘。已经发现，磁场分布随时间变化是不均匀的，并且峰值磁场比Ni-Fe磁头的驱动电流晚几纳秒。这些磁头的频率特性对应于磁场延迟与驱动电流。磁场延迟较长的磁头的频率特性比磁场延迟较短的磁头的频率特性差。

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