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Microtrack profiling technique for narrow track tape heads

机译:窄带磁头的微带轮廓技术

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摘要

Microtrack properties of magnetoresistive (MR) tape heads are difficult to measure with conventional microtrack profiling techniques. The authors present a technique for rapid and dynamic measurement of these profiles for tape heads as narrow as 5 mu m using a 5 mu m-wide write head translated on a sinusoidal trajectory. The authors have used this technique on two types of tape heads, one where the only longitudinal bias is due to the shape anisotropy and one where exchange bias elements are used for end stabilization. These profiles give insight into the domain structure of the sensor and can be used as a diagnostic tool to predict head Barkhausen noise levels.
机译:磁阻(MR)磁头的微磁道特性很难用常规的微磁道轮廓分析技术测量。作者介绍了一种技术,可以使用正弦形轨迹平移的5微米宽的写头,快速动态地测量窄至5微米的磁带头的这些轮廓。作者已经在两种类型的磁带头上使用了这种技术,一种类型的磁带头唯一的纵向偏置是由于形状各向异性而另一种类型的交换头用于端部稳定化。这些配置文件可以深入了解传感器的域结构,并且可以用作诊断工具来预测头部巴克豪森噪声水平。

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