The magnetic annealing behavior of electroplated, 2.00- mu m-thick, NiFe films containing nominally 82% Ni, in the temperature range from 100 to 500 degrees C, was investigated through characterization of the structural properties of full films and the domain configurations of films shaped like an inductive-head yoke. A transition in the magnetic properties of the films was observed in the temperature regime of 350-450 degrees C. Concomitant changes in film stress from 0.2 to 1.4 GPa and in magnetostriction from -2.2 to -3.5*10/sup -6/ were measured across the transition. Transmission electron micrographs and X-ray diffraction analysis showed that recrystallization with
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