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首页> 外文期刊>Magnetics, IEEE Transactions on >Study of the Noise in Multicore Orthogonal Fluxgate Sensors Based on Ni-Fe/Cu Composite Microwire Arrays
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Study of the Noise in Multicore Orthogonal Fluxgate Sensors Based on Ni-Fe/Cu Composite Microwire Arrays

机译：基于Ni-Fe / Cu复合微丝阵列的多芯正交磁通门传感器的噪声研究

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摘要

In this paper, a set of microwire arrays based on Ni-Fe/Cu composite wires were fabricated as the multicore sensing elements with different number of wires and different structures. The longitudinal hysteresis loops showed that the anisotropy of the arrays changed in different structures. The sensitivity of the multicore orthogonal fluxgate sensor increased exponentially with the increase of number of wires in the arrays, whereas the noise level depended on the working mode and structure of the microwire arrays. In the fundamental mode, a minimum noise level of 42 pT/rtHz@1 Hz was obtained with a 5-wire array, and in the second harmonic mode a minimum noise level of 177 pT/rtHz@1 Hz was obtained with the same array. Investigation of the relationship between the magnetic properties and the microwire array structures revealed a collective compactedness value which is able to describe the interaction effect in wires and to predict the favorable array structure based on the ratio of effective contact volume to the total material volume.
机译：本文以Ni-Fe / Cu复合线为基础，制作了一组微丝阵列作为多芯传感元件，具有不同数量的导线和不同的结构。纵向磁滞回线表明，阵列的各向异性在不同的结构中发生了变化。多芯正交磁通门传感器的灵敏度随阵列中导线数量的增加呈指数增长，而噪声水平取决于微导线阵列的工作模式和结构。在基本模式下，使用5线阵列获得的最小噪声电平为42 pT / rtHz @ 1 Hz，而在第二谐波模式下，使用相同阵列的获得的最小噪声电平为177 pT / rtHz @ 1 Hz 。对磁性能和微丝阵列结构之间关系的研究揭示了一个集体压紧度值，该值能够描述导线中的相互作用效应，并基于有效接触体积与总材料体积之比预测有利的阵列结构。

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