Reliability-Enhanced Separated Pre-Charge Sensing Amplifier for Hybrid CMOS/MTJ Logic Circuits

著录项

• 来源
  《IEEE Transactions on Magnetics》 |2017年第9期|1-5|共5页
• 作者

  Deming Zhang; Lang Zeng; Tianqi Gao; Fanghui Gong; Xiaowan Qin; Wang Kang; Yue Zhang; Youguang Zhang; Jacques Olivier Klein; Weisheng Zhao;

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• 作者单位

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

  Center de Nanoscience et de Nanotechnologies (C2N-Orsay), University of Paris-Sud, Orsay, France;

  Fert Beijing Institute, BDBC, Beihang University, Beijing, China;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Sensors; Discharges (electric); Magnetic tunneling; Logic circuits; Integrated circuit reliability; Resistance;

  机译：传感器;放电（电）;电磁隧穿;逻辑电路;集成电路可靠性;电阻;