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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Wideband Power/Ground Noise Suppression in Low-Loss Glass Interposers Using a Double-Sided Electromagnetic Bandgap Structure
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Wideband Power/Ground Noise Suppression in Low-Loss Glass Interposers Using a Double-Sided Electromagnetic Bandgap Structure

机译：使用双面电磁带隙结构在低损耗玻璃插入器中宽带电源/地面噪声抑制

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摘要

In this article, we propose a double-sided electromagnetic bandgap (DS-EBG) structure for glass interposers (GIs) with low substrate loss to suppress power/ground noise. For the first time, we validated wideband power/ground noise suppression in the GI using the proposed DS-EBG structure based on dispersion analysis and experimental verification. We experimentally verified that the proposed DS-EBG structure achieved the power/ground noise suppression (below -40 dB) between 2.5 and 8.9 GHz in the GI. Derived stopband edges, f(L) and f(U) based on the dispersion analysis, and 3-D electromagnetic (EM) simulation showed a good correlation with measurements. The effectiveness of the proposed DS-EBG structure on the power/ground noise suppression is verified by analyzing noise propagation in the power distribution network and coupling to the GI channel. Using the 3-D EM simulation, we verified that the proposed DS-EBG structure suppressed the power/ground noise coupling and improved the eye diagram of the GI channel. Finally, we propose a design methodology to broaden the isolation bandgap or miniaturize the dimensions based on the dispersion analysis.
机译：在本文中，我们提出了一种用于玻璃插入器（GIS）的双面电磁带隙（DS-EBG）结构，具有低基板损耗，以抑制功率/地噪声。首次，我们使用基于色散分析和实验验证的所提出的DS-EBG结构验证了GI中的宽带电源/地噪声抑制。我们通过实验验证了所提出的DS-EBG结构在GI中实现了2.5和8.9GHz之间的功率/地噪声（低于-40 dB）。基于色散分析和3-D电磁（EM）模拟的衍生阻带边缘，F（L）和F（U）显示出与测量的良好相关性。通过分析配电网络中的噪声传播并与GI通道耦合来验证所提出的DS-EBG结构对功率/地噪声抑制的有效性。使用3-D EM仿真，我们验证了所提出的DS-EBG结构抑制了功率/地噪声耦合并改进了GI通道的眼图。最后，我们提出了一种设计方法来扩大隔离带隙或基于分散分析小型化尺寸。

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