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首页> 外文期刊>IEEE transactions on nanotechnology >New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs
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New OBIST Using On-Chip Compensation of Process Variations Toward Increasing Fault Detectability in Analog ICs

机译：新的OBIST使用片上工艺补偿来提高模拟IC的故障检测能力

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摘要

A new on-chip oscillation test strategy for analog and mixed-signal circuits is presented. In the proposed method, on-chip Schmitt trigger is used as the on-chip frequency reference to compensate the influence of process parameter variations. Furthermore, this solution also brings the possibility to implement Oscillation-based Built-In Self-Test (OBIST) for analog and mixed-signal integrated circuits. The proposed OBIST strategy has been experimentally applied to active analog integrated filters, and its efficiency in detecting hard-detectable catastrophic faults is presented. To demonstrate applicability of the proposed method also in nanoscale technologies, the method has been used to test a non-inverting amplifier designed in 90 nm CMOS technology. Consequently, the impact of scaling was analyzed and the method efficiency in covering catastrophic faults achieved for 0.35 $mu$m and 90 nm CMOS technology were compared.
机译：提出了一种新的模拟和混合信号电路的片上振荡测试策略。在所提出的方法中，片上施密特触发器用作片上频率参考，以补偿过程参数变化的影响。此外，该解决方案还提供了为模拟和混合信号集成电路实现基于振荡的内置自测（OBIST）的可能性。所提出的OBIST策略已被实验性地应用于有源模拟集成滤波器，并提出了其在检测难以检测到的灾难性故障中的效率。为了证明所提出的方法在纳米技术中的适用性，该方法已用于测试采用90nm CMOS技术设计的同相放大器。因此，分析了结垢的影响，并针对0.35 <公式公式类型=“ inline”> $ mu $ m和90nm实现了覆盖灾难性故障的方法效率比较了CMOS技术。

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