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首页> 外文期刊>Nuclear Science, IEEE Transactions on >Measurements of Matching and Noise Performance of a Prototype Readout Chip in 40 nm CMOS Process for Hybrid Pixel Detectors
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Measurements of Matching and Noise Performance of a Prototype Readout Chip in 40 nm CMOS Process for Hybrid Pixel Detectors

机译:用于混合像素检测器的40nm CMOS工艺中原型读取芯片的匹配和噪声性能测量

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The paper presents a prototype integrated circuit built in a 40 nm CMOS process for readout of a hybrid pixel detector. The core of the IC constitutes a matrix of pixels with the pixel size of . The paper explains the functionality and the architecture of the IC, which is designed to operate in both the standard single photon counting mode and the single photon counting mode with interpixel communication to mitigate negative effects of charge sharing. This article focuses on the measurement results of the IC operating in the standard single photon counting mode. The measured ENC is (for the peaking time of 48 ns), the gain is , while the effective threshold dispersion is .
机译:本文提出了一种原型集成电路,该集成电路采用40 nm CMOS工艺构建,用于读出混合像素检测器。 IC的核心构成像素矩阵,像素大小为。本文介绍了IC的功能和体系结构,该IC被设计为在标准的单光子计数模式和像素间通信的单光子计数模式下工作,以减轻电荷共享的负面影响。本文重点介绍在标准单光子计数模式下运行的IC的测量结果。测得的ENC为(对于48ns的峰值时间),增益为,而有效阈值色散为。

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