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A 20-ps Time-to-Digital Converter (TDC) Implemented in Field-Programmable Gate Array (FPGA) with Automatic Temperature Correction

机译:在具有自动温度校正功能的现场可编程门阵列(FPGA)中实现的20 ps时间数字转换器(TDC)

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摘要

This paper presents an automatic temperature correction design for carry chain based time-to-digital converter (TDC) in field-programmable gate array (FPGA). The bin-by-bin calibrations under different temperatures are performed for both plain TDC and Wave Union TDC to characterize the influence of temperature variation on the delay time of carry chain. Accordingly, a simplified temperature correction scheme by using a dedicated correction channel to measure the coefficient and correct fine time result for all TDC channels is implemented and tested. This method shows only few picosecond errors for both simulation and measurement. With this correction approach, a TDC precision of 21 ps has been achieved in Cyclone II FPGA under a wide ambient temperature range from 0 $^circ{rm C}$ to 60 $^circ{rm C}$. Several design key points are also described in this paper.
机译:本文提出了一种用于现场可编程门阵列(FPGA)中基于进位链的时间数字转换器(TDC)的自动温度校正设计。对普通TDC和Wave Union TDC在不同温度下进行逐个箱校准,以表征温度变化对进位链延迟时间的影响。因此,实施并测试了通过使用专用校正通道来测量系数并校正所有TDC通道的精确时间结果的简化温度校正方案。对于仿真和测量,此方法仅显示很少的皮秒误差。通过这种校正方法,在Cyclone II FPGA中,在从0℃到60℃的宽环境温度范围内,TDC精度已达到21 ps。本文还介绍了几个设计要点。

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