Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

Kruckmeyer K.; Rennie R.L.; Ramachandran V.

首页> 外文期刊>IEEE Transactions on Nuclear Science >Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

【24h】

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

机译：使用代码错误和差拍频率测试方法来识别1 GHz模数转换器中的单事件翻转敏感电路

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency. With this method, the impact of an ion strike can be seen over the full code range of the output. The error signatures from this testing can provide clues to which area of the ADC is sensitive to an ion strike.

机译：表征模数转换器（ADC）单事件翻转性能的典型测试方法涉及将输入保持在静态值。结果，仅在少数输入电压和输出代码中看到了输出错误签名。使用输入拍频和输出代码错误检测的测试方法可使ADC表征为具有高频动态输入。使用这种方法，可以在输出的整个代码范围内看到离子撞击的影响。该测试中的错误签名可以提供线索，提示ADC的哪个区域对离子撞击敏感。

著录项

来源
《IEEE Transactions on Nuclear Science》 |2008年第4期|p.2013-2018|共6页
作者
Kruckmeyer K.; Rennie R.L.; Ramachandran V.;
展开▼
作者单位

展开▼
收录信息
原文格式 PDF
正文语种 eng
中图分类原子能技术;
关键词
analogue-digital conversion; error detection codes; integrated circuit testing; analog-to-digital converter; beat frequency test; code error; error signatures; frequency 1 GHz; ion strike; single event upset sensitive circuits; Analog–digital conversion; bea;

机译：模数转换;错误检测代码;集成电路测试;模数转换器;拍频测试;代码错误;错误签名;频率1 GHz;离子打击;单事件失灵敏感电路;模拟数字转换;bea;

相似文献

外文文献
中文文献
专利

1. A new design methodology for voltage-to-frequency converters (VFCs) circuits suitable for time-based analog-to-digital converters (T-ADCs) [J] . ElGabry Mohammed A., Hassan Ali H., Mostafa Hassan, Analog Integrated Circuits and Signal Processing . 2018,第2期

机译：适用于基于时间的模数转换器的电压到频率转换器（VFC）电路的新设计方法（T-ADC）
2. Design of Digital Circuits Using Inverse-Mode Cascode SiGe HBTs for Single Event Upset Mitigation [J] . Thrivikraman T. K.Wilcox E.Phillips S. D.Cressler J. D.Marshall C.Vizkelethy G.Dodd P.Marshall P. Nuclear Science, IEEE Transactions on . 2010,第6期

机译：使用反模式Cascode SiGe HBT的数字电路设计可缓解单事件扰动
3. Characterization of single-event upsets in a flash analog-to-digital converter (AD9058) [J] . Buchner S.P., Meehan T.J. IEEE Transactions on Nuclear Science . 2000,第6期

机译：闪存模数转换器中的单事件翻转的特征（AD9058）
4. Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method [C] . Kruckmeyer, Kirby, Rennie, . 2007

机译：使用拍频测试方法对具有动态输入的GHz模数转换器的单事件翻转表征
5. Design techniques and implementations of high-speed analog communication circuits: Two analog-to-digital converters and a 3.125Gb/s receiver. [D] . Younis, Ahmed Abdell-Ra'oof. 2001

机译：高速模拟通信电路的设计技术和实现：两个模数转换器和一个3.125Gb / s接收器。
6. Modeling and Experimental Demonstration of a Hopfield Network Analog-to-Digital Converter with Hybrid CMOS/Memristor Circuits [O] . Xinjie Guo, Farnood Merrikh-Bayat, Ligang Gao, 2015

机译：具有混合CMOS /忆阻器电路的Hopfield网络模数转换器的建模和实验演示
7. Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter [O] . Kirby Kruckmeyer, Robert L. Rennie, Vishwanath Ramach 2012

机译：使用代码错误和拍频测试方法来识别1 GHz模数转换器中的单事件翻转敏感电路

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

摘要

著录项

相似文献

相关主题

期刊订阅