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Analytical and experimental dosimetry techniques for calibrating a low energy X-ray radiation source

机译:用于校准低能X射线辐射源的分析和实验剂量法技术

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摘要

This paper describes the method used to calibrate a large-volume continuous-wave X-ray radiation test chamber. The X-ray tube has a tungsten target and emits a bremsstrahlung X-ray spectrum with end point energies up to 160 keV. Analytical tools and experimental dosimetry techniques were developed to map the radiation field intensity and the resulting dose-deposition profiles in a variety of materials throughout the chamber. Three detector types (X-ray vacuum diodes, silicon PIN diodes, and PMOS FETs) were used to measure spectral intensity and dose deposition in silicon devices. CEPXS and PHOTCOEF electron-photon transport codes were used to calculate the incident spectral energy distribution and the energy deposition in the detector. Calculated and experimental diode detector responses agreed to within 10 percent over the full energy range. PMOS FETs were used to demonstrate the correlation between total-dose-deposited in the X-ray chamber and in the Cobalt-60 cell. The results of this effort provide dosimetry and analysis tools needed to perform ionizing radiation testing of large area (0.5 m/sup 2/) electronic subsystems.
机译:本文介绍了用于校准大体积连续波X射线辐射测试箱的方法。 X射线管具有钨靶,并发射a致辐射的X射线光谱,其终点能量高达160 keV。开发了分析工具和实验剂量测定技术,以绘制整个腔室内各种材料中的辐射场强度和所产生的剂量沉积曲线。三种检测器类型(X射线真空二极管,硅PIN二极管和PMOS FET)用于测量硅器件中的光谱强度和剂量沉积。使用CEPXS和PHOTCOEF电子-光子传输代码来计算入射光谱能量分布和探测器中的能量沉积。在整个能量范围内,计算得出的和实验性的二极管检测器响应均在10%以内。使用PMOS FET来证明在X射线腔室和Cobalt-60电池中沉积的总剂量之间的相关性。这项工作的结果提供了进行大面积(0.5 m / sup 2 /)电子子系统的电离辐射测试所需的剂量学和分析工具。

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