...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Power Electronics, IEEE Transactions on >Accelerated Ageing of Metallized Film Capacitors Under High Ripple Currents Combined With a DC Voltage
【24h】

Accelerated Ageing of Metallized Film Capacitors Under High Ripple Currents Combined With a DC Voltage

机译：高纹波电流和直流电压作用下金属化薄膜电容器的加速老化

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In view of their potential for high dielectric breakdown strengths, low dissipation factors, and good dielectric stability over a wide range of frequencies and temperature, metallized films capacitors are very used components for aeronautic applications. Nevertheless, capacitors remain unreliable components; a good acquaintance of their deterioration over time would enable us to perform a predictive maintenance on the component and thus improve the availability of the whole system. This operation requires the knowledge of the capacitor ageing law and their failure mechanisms associated with the application. In a standard six pulses rectifier-fed pulse width modulation inverter, dc-link capacitors are generally subjected to gradients of temperature due to the encountered electrical stresses. Since traditional floating ageing tests, which consist on applying constant voltages and temperature across the component, do not reflect the normal ageing of the component, we propose in this paper to study the degradation kinetics of metallized films capacitors under high ripple currents, alone or combined with a dc voltage across the devices terminals. It will therefore reproduce with a more representative way the ageing of the component in comparison with the traditional floating ageing tests. Based on the resonant circuit properties, the ageing test bench especially developed for our study provides high currents and voltages from a low power source. Through the study and analysis of the capacitors parameters evolution under high ripple currents, an original ageing law is proposed to model the capacitance decrease with time based on the electrochemical corrosion of the capacitors electrodes. The adequacy between the experimental points and the model proved the validity of the proposed law.
机译：考虑到它们在较高的频率和温度范围内具有较高的介电击穿强度，较低的损耗因子以及良好的介电稳定性的潜力，金属化薄膜电容器是航空应用中非常常用的组件。然而，电容器仍然是不可靠的组件。很好地了解它们随着时间的推移而退化，将使我们能够对组件执行有计划的维护，从而提高整个系统的可用性。此操作需要了解电容器老化定律及其与应用相关的故障机理。在标准的六脉冲整流器馈电的脉宽调制逆变器中，直流母线电容器通常会由于遇到的电应力而经受温度梯度的影响。由于传统的浮动老化测试（包括在组件上施加恒定电压和温度）不能反映组件的正常老化，因此我们建议在本文中研究单独或组合使用的高波纹电流下金属化薄膜电容器的退化动力学。设备两端的直流电压。因此，与传统的浮动老化测试相比，它将以更具代表性的方式再现组件的老化。根据谐振电路的特性，专门为我们的研究开发的老化测试台可从低电源提供高电流和高电压。通过对高纹波电流下电容器参数演变的研究和分析，提出了一种基于电容器电极电化学腐蚀的原始老化规律，以模拟电容随时间的减小。实验点和模型之间的充分性证明了该法的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号