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Accelerated Life Testing With Semiparametric Modeling of Stress Effects

机译:应力影响半参数加速寿命测试

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Accelerated life testing has been widely applied to obtain the reliability information of an asset (component) at use conditions when the component is highly reliable. In accelerated life testing, tested components are exposed to stress levels more severe than usual so that more component failures can be observed in a short period of time. Most existing statistical models assume a known parametric relationship between the lifetime (or lifetime characteristic) and accelerating stresses. In this paper, we propose semiparametric modeling for the relationship between the lifetime characteristic and accelerating stresses. The proposed model is suitable for both single and multiple accelerating stress cases. A maximum penalized likelihood estimation method is developed to estimate the model parameters. A simulation study is implemented to illustrate the performance of the proposed model, and a real-world case study is conducted to demonstrate the proposed model.
机译:加速寿命测试已广泛应用于在组件高度可靠的使用条件下获取资产(组件)的可靠性信息。在加速寿命测试中,被测组件承受的压力比平时还要严重,因此可以在短时间内观察到更多的组件故障。大多数现有的统计模型都假设寿命(或寿命特性)与加速应力之间存在已知的参数关系。在本文中,我们针对寿命特性和加速应力之间的关系提出了半参数建模。所提出的模型适用于单个和多个加速应力情况。开发了一种最大惩罚似然估计方法来估计模型参数。进行仿真研究以说明所提出模型的性能,并进行了实际案例研究以证明所提出的模型。

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