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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Quantification of the Effect of Multiple Scattering on Array Imaging Performance
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Quantification of the Effect of Multiple Scattering on Array Imaging Performance

机译：定量散射对阵列成像性能的影响

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摘要

A quantitative assessment of the detection limit is an important task in a range of fields, where imaging in a random scattering medium is performed. All images suffer, to varying extents, from coherent noise, including speckle caused by material microstructure. The quality of images can be greatly improved by using phased arrays because of the possibility to focus backscattered signals in transmission and reception. As a consequence, under the single scattering assumption, the signal-to-noise ratio (SNR) increases with frequency due to better focusing. However, in reality, material structural noise severely affects the detection performance, especially at high frequencies and large penetration depths. The actual detection limit depends on the type of imaged target and the material properties, but the underlying physical reason is the same and is related to the increase in the contribution of multiple scattering to the measured data. Thus, in this article, a method for estimating the proportion of the multiple scattering contribution in the total image intensity is proposed. Experimental results are presented for ultrasonic array immersion imaging of a collection of randomly distributed steel rods, as well as direct contact imaging of highly scattering polycrystalline materials. It is shown that the SNR as a function of frequency and imaging depth is directly correlated with the measured single scattering rate. Moreover, the detection limit corresponds to the onset of the dominant multiple scattering regime, when the multiple scattering rate approaches 100.
机译：对检测极限的定量评估是在一定范围内的一项重要任务，在该范围内执行随机散射介质中的成像。所有图像都会在不同程度上遭受相干噪声的影响，包括由材料微观结构引起的斑点。通过使用相控阵可以大大提高图像质量，因为可以在发送和接收中集中反向散射的信号。结果，在单个散射假设下，由于更好的聚焦，信噪比（SNR）随频率增加。但是，实际上，材料的结构噪声会严重影响检测性能，尤其是在高频和大穿透深度的情况下。实际的检测极限取决于成像目标的类型和材料特性，但是潜在的物理原因是相同的，并且与多重散射对测量数据的贡献增加有关。因此，在本文中，提出了一种估计多重散射贡献在总图像强度中所占比例的方法。给出了随机分布的钢棒的超声阵列浸没成像以及高散射多晶材料的直接接触成像的实验结果。结果表明，作为频率和成像深度的函数的SNR与测得的单个散射率直接相关。此外，当多重散射率接近100时，检测极限对应于主要多重散射机制的开始。

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