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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Combining Simulated and Experimental Data to Simulate Ultrasonic Array Data From Defects in Materials With High Structural Noise
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Combining Simulated and Experimental Data to Simulate Ultrasonic Array Data From Defects in Materials With High Structural Noise

机译：结合模拟和实验数据以模拟具有高结构噪声的材料中缺陷的超声波阵列数据

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摘要

Ultrasonic nondestructive testing inspections using phased arrays are performed on a wide range of components and materials. All real inspections suffer, to varying extents, from coherent noise, including image artifacts and speckle caused by complex geometries and grain scatter, respectively. By its nature, this noise is not reduced by averaging; however, it degrades the signal-to-noise ratio of defects and ultimately limits their detectability. When evaluating the effectiveness of an inspection, a large pool of data from samples containing a range of different defects are important to estimate the probability of detection of defects and to help characterize them. For a given inspection, coherent noise is easy to measure experimentally but hard to model realistically. Conversely, the ultrasonic response of defects can be simulated relatively easily. This paper proposes a novel method of simulating realistic array data by combining noise-free simulations of defect responses with coherent noise taken from experimental data. This removes the need for costly physical samples with known defects to be made and allows for large data sets to be created easily.
机译：使用相控阵进行的超声波无损检测检查是针对多种组件和材料进行的。所有实际检查都会在不同程度上遭受相干噪声的影响，包括分别由复杂几何形状和颗粒散布引起的图像伪影和斑点。从本质上讲，这种噪声不会通过平均降低。但是，它降低了缺陷的信噪比，并最终限制了它们的可检测性。在评估检查的有效性时，来自包含一系列不同缺陷的样本的大量数据对于评估缺陷检测的可能性并帮助表征它们很重要。对于给定的检查，相干噪声很容易通过实验测量，但很难进行实际建模。相反，缺陷的超声响应可以相对容易地模拟。本文提出了一种新颖的方法，通过结合缺陷响应的无噪声模拟和从实验数据中获取的相干噪声，来模拟真实的阵列数据。这样就无需制作具有已知缺陷的昂贵的物理样本，并允许轻松创建大型数据集。

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