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Experimental and numerical investigations of vibration characteristics for parallel-type and series-type triple-layered piezoceramic bimorphs

机译:平行型和串联型三层压电陶瓷双压电晶片振动特性的实验和数值研究

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The dynamic characteristics of parallel-type and series-type piezoelectric bimorphs are analyzed in this study. The transverse (out-of-plane) and planar (in-plane) vibrations for piezoceramic bimorphs in normal and abnormal connections are investigated experimentally by 2 noncontact optical techniques and impedance analyzer. Electronic speckle pattern interferometry (ESPI) is the major experimental technique for measuring the resonant frequency and corresponding vibration mode shape. Out-of-plane and in-plane vibrations of piezoelectric bimorphs at resonance are obtained by a selfarranged ESPI optical setup. The laser Doppler vibrometer (LDV) is a point-wise measurement technique for out-of-plane displacement and is used to determine the out-of-plane resonant frequencies. The impedance analyzer is used to measure the resonant frequencies for in-plane motions. It is noted from the experimental results that the out-of-plane modes are the dominant motion for the normal connection and only symmetric vibration mode shapes can be excited. The in-plane motions are large enough to be measured using the ESPI method for normal connections. The in-plane resonant modes are observed for parallel-type piezoelectric bimorph in parallel connections; however, the in-plane mode shapes are similar to the out-of-plane mode shapes for the series-type piezoelectric bimorph in series connection. Hence, the particle motions of the piezoelectric bimorph at resonance are essentially 3-D for the normal connection. It is interesting to note that both symmetric and asymmetric out-of-plane vibration mode shapes can be excited with large applied voltage but no in-plane motion is observed for the abnormal connection. In addition to experimental methods, numerical computations based on the finite element method are used to verify the experimental results. Good agreements of the resonant frequencies and mode shapes are obtained for experimental and numerical results.
机译:分析了平行型和串联型压电双压电晶片的动态特性。通过2种非接触式光学技术和阻抗分析仪,通过实验研究了压电陶瓷双压电晶片在正常和异常连接中的横向(平面外)和平面(平面内)振动。电子散斑干涉法(ESPI)是测量共振频率和相应振动模式形状的主要实验技术。压电双压电晶片谐振时的平面外和平面内振动是通过自配置的ESPI光学装置获得的。激光多普勒振动计(LDV)是用于平面外位移的逐点测量技术,用于确定平面外共振频率。阻抗分析仪用于测量平面内运动的共振频率。从实验结果中可以看出,平面外模式是法向连接的主要运动,并且只能激发对称振动模式的形状。平面内运动足够大,可以使用ESPI方法对正常连接进行测量。对于并联连接的并联型压电双压电晶片,观察到面内谐振模式。然而,面内模式形状类似于串联连接的串联型压电双压电晶片的面外模式形状。因此,对于正常连接,压电双压电晶片共振时的粒子运动基本上为3-D。有趣的是,对称和非对称平面外振动模式形状都可以通过施加较大的电压来激励,但是对于异常连接,没有观察到平面内运动。除实验方法外,还基于有限元方法进行了数值计算,以验证实验结果。对于实验和数值结果,谐振频率和模态形状具有良好的一致性。

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