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A method of 'weak resonance' for quality factor and coupling coefficient measurement in piezoelectrics

机译:压电中品质因数和耦合系数测量的“弱共振”方法

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In the absolute-immittance spectrum of a piezoelectric resonator (PR), if the relative resonance-antiresonance frequency interval of a high-intensity resonance is basically determined by the coefficient of electromechanical coupling (CEMC), the relative resonance-antiresonance frequency interval of a low-intensity resonance with the resonance-antiresonance attenuation less than 15 dB, regardless of the reason, is determined by the quality factor Q of the resonance, and its intensity is proportional to the CEMC. The technique for the quality factor and CEMC determination based on the "weak resonance" (WR) concept has been formulated and then applied to low-Q and/or low-CEMC piezoelectrics, including the initial stage of piezoceramics polarization, and to piezotransducers under electrical or mechanical loading with maximum efficiency. The WR method allows one to determine the quality factor on PRs under specific conditions, such as arbitrary PR shape resulting to a broken frequency spectrum; PRs with an extremely large or extremely low electrical capacitance; at high-order PR harmonics; electrodeless piezoelements under mechanically contactless electrical excitation; determining the local thickness-mode material quality factor value and its distribution along the surface of a thin electrodeless piezoplate- all this where the traditional methods show a poor performance or do not work at all.
机译:在压电谐振器(PR)的绝对辐射谱中,如果高强度谐振的相对谐振-反谐振频率间隔基本上由机电耦合系数(CEMC)确定,则a的相对谐振-反谐振频率间隔为无论何种原因,共振强度-反共振衰减均小于15 dB的低强度共振取决于共振的品质因数Q,其强度与CEMC成正比。已经提出了基于“弱谐振”(WR)概念的品质因数和CEMC测定技术,然后将其应用于低Q和/或低CEMC压电,包括压电陶瓷极化的初始阶段,以及应用于电气或机械负载,效率最高。 WR方法可以确定特定条件下PR的品质因数,例如任意PR形状会导致频谱破裂;具有极大或极低电容的PR;在高阶PR谐波下;机械无接触电激励下的无电极压电元件;确定局部厚度模式的材料质量因子值及其在薄的无电极压电板表面上的分布-所有这些都使传统方法表现不佳或根本无法使用。

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