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Thin film bulk acoustic wave filter

机译:薄膜体声波滤波器

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摘要

Thin film bulk acoustic wave (BAW) resonators (FBAR) are fabricated on a silicon nitride bridge using a ZnO piezolayer on a glass substrate and surface micromachining by standard thin film technology. These resonators exhibit a coupling constant kt2=7.8% at the first thickness extensional wave mode and are used as impedance elements in a ladder filter in the 1-GHz frequency band of mobile telecommunications. An electrical equivalent circuit is used to characterize the properties of the resonators and to show how the performance of the filter depends on the parameters of the resonators. 2.5% bandwidth, 2.8-dB insertion loss, and 35-dB selectivity are obtained in a filter with six resonators. The technology can be used to manufacture miniature microwave filters without any additional inductances.
机译:薄膜体声波(BAW)谐振器(FBAR)在氮化硅桥上使用ZnO压电层在玻璃基板上进行制造,并通过标准薄膜技术进行表面微加工。这些谐振器在第一厚度扩展波模式下表现出耦合常数kt2 = 7.8%,并在移动电信的1-GHz频带中用作梯形滤波器中的阻抗元件。等效电路用于表征谐振器的特性,并显示滤波器的性能如何取决于谐振器的参数。在具有六个谐振器的滤波器中,可获得2.5%的带宽,2.8 dB的插入损耗和35 dB的选择性。该技术可用于制造没有任何附加电感的微型微波滤波器。

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