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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Channel defect detection in food packages using integrated backscatter ultrasound imaging
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Channel defect detection in food packages using integrated backscatter ultrasound imaging

机译：使用集成反向散射超声成像检测食品包装中的通道缺陷

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摘要

Hermetically-sealed flexible food packages require very effective seal integrity testing to extend the shelf stability of thermally processed food. The initial goal of this study was to estimate the detection limits of laboratory-generated channels which simulate defects in food packages using pulse-echo ultrasonic imaging techniques. Packages with well characterized (via transmission optical microscopy) laboratory-generated channels that simulate defects with diameters between 9 and 325 /spl mu/m in the seal plane traversing the major axis of the heat seal were generated in heat-sealed microwavable retort-pouch plastic film (trilaminate). Pulse-echo techniques in the 13-17 MHz center frequency range were investigated. The samples were examined with a conventional B-mode imaging technique, which was found to be inadequate for subwavelength imaging of the types of typical channel defects found in shelf-stable food packages. Based on conventional B-mode image features, a new goal of this study was established to develop and evaluate an imaging technique which would exhibit subwavelength imaging capabilities. The new imaging technique called backscattered amplitude integral (BAI) is introduced here. It was observed that BAI-mode imaging has the ability for subwavelength detection of channel defects, e.g., detection of a 10-/spl mu/m diameter channel defect at a center frequency of 13.1 MHz (/spl lambda/=182 /spl mu/m).
机译：密封的柔性食品包装需要非常有效的密封完整性测试，以延长热处理食品的货架稳定性。这项研究的最初目标是估计使用脉冲回波超声成像技术模拟食品包装中缺陷的实验室生成通道的检测限。在热密封的微波杀菌袋中产生了具有良好特征（通过透射光学显微镜）的实验室产生的通道的包装，这些通道模拟了在横穿热封主轴的密封平面中直径在9到325 / spl mu / m之间的缺陷。塑料薄膜（三层）。研究了13-17 MHz中心频率范围内的脉冲回波技术。使用常规的B模式成像技术对样品进行了检查，发现该技术不足以对在货架稳定的食品包装中发现的典型通道缺陷类型进行亚波长成像。基于常规的B模式图像特征，建立了本研究的新目标，以开发和评估将展现亚波长成像功能的成像技术。这里介绍了一种新的成像技术，称为反向散射振幅积分（BAI）。观察到BAI模式成像具有亚波长检测通道缺陷的能力，例如，在中心频率13.1 MHz（/ spl lambda / = 182 / spl mu的情况下，检测直径为10- / spl mu / m的通道缺陷/ m）。

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